|
|
| |
|
|
|
|
|
|
 Click to enlarge image
|
System Division
IGM (In Glass Laser Marker)
System Features
- Zero surface fault by inside glass marking
- Minimum marking character : 10㎛
- Marking Position Accuracy : ±5㎛
- Marking position measurement and quality review are possible after marking
- In-line automatic system
Glass Etcher
This system has been used for several years in Nova Tech and proved its production capability and reliability.
System Feature
- Processing Glass Size : 100*100 ~ 730*920 mm
- Chemical Etching Type
- Dipping & Batch
- Etch Rate : Configurable
- Accuracy : ≤ 5%
- Taper(Slope) Width : ≤ 45°
Color Scope
 |
System Feature
- Products to be Measured: BLU, PDP, TFT-LCD, OLED
- Measurement Items : Color Spectrum Curve, Brightness, Chromaticity, Color Temperature, Display Consistency, Response Time, Flicker, Sight Angle, Color Movement
- Applicable Areas: Display R&D, Quality Test in the Production Line
3D and Visual Analysis System for the Optical Characteristics of Emitting Surface
|
Specifications
| Brightness & Accuracy |
0.01 cd/m2 - 100,000 cd/m2 , ±3 % |
| Repeated Accuracy |
±0.5 % |
| Chromaticity Accuracy |
±0.005 (x-, y-value by CIE 1931, u'-, v'-value by CIE 1976) |
| Spectrum Wavelength |
380 ~ 760nm ( Resolution 0.6 nm ) |
| Test Time |
Less than 0.2 sec (Brightness ) 3 ~ 20 sec (Brightness, Chromaticity ) |
| Response Time & Accuracy |
Less than 0.5sec ( Resolution 60us ), ±3 % |
| Flicker Accuracy |
±1Hz (Resolution 60us ) |
| Applicable Areas |
BLU, CRT, OLED, LCD, PDP |
| Light Measurement |
Spectrum, Brightness, Chromaticity, Consistency, Color Temperature, Filter and Liquid Transmissivity |
| Display Property Measurement |
Response Time, Flicker, Sight Angle, Color Movement, Noise, Brightness Contrast, Gamma Value |
| Surface Size for Measurement |
From a height of 1200mm, 400mm x 300mm (20 inch) . For other sizes, samples should be separately produced |
| Dimension & Weight |
Head:160mmx195mmx390mm, 7 kg Stand:80x40mmx1200mm, 15 kg |
Vision Tester
-BLU Test-
 |
 |
 |
 |
| |
Test for Alien Materials |
Dust/Black Spot/White Spot Test |
Scratch Test |
-CMOS Image Sensor Test
 |
System Feature
- Test for alien materials, scratches, defective pixels and RGB characteristic faults
- Measurement of the size and location of faults
- Lenz Auto Focusing
- Image magnification
- Open/Short property test
- UPH 700 (For mobile BLU)
- In-line automatic test
- Applicable for customized tests
|
|
|
|
|
| |
|
|
|
Related Keywords:
Bookmark / Share this page